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Workload-Driven HBF Substrate For Capacity-Scalable LLM Inference (Huawei, ETH Zurich, HUST)

semiengineering.com · 14d

Researchers at Huawei, ETH Zürich, and HUST published a technical paper titled “FLINT: Efficiently Leveraging High Bandwidth Flash for Capacity-Scalable LLM Inference Acceleration.” Abstract: “LLM inference is increasingly constrained by accelerator memory capacity rather than compute throughput. This constraint is especially acute in single-accelerator and small-node inference systems, where limited on-package memory capacity restricts the... » read more The post Workload-Driven HBF Substrate For Capacity-Scalable LLM Inference (Huawei, ETH Zurich, HUST) appeared first on Semiconductor Engineering .

First report: Hybrid HBM-HBF Architecture in LLM Inference (University of Oxford) semiengineering.com, 16d

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